Nondestructive Evaluation of Semiconductor Materials and Devices by J. Zemel

Cover of: Nondestructive Evaluation of Semiconductor Materials and Devices | J. Zemel

Published by Springer .

Written in English

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Subjects:

  • Electronics - Semiconductors,
  • Engineering - Electrical & Electronic,
  • Technology / Engineering / Electrical,
  • Technology & Industrial Arts,
  • Semiconductors,
  • Testing

Edition Notes

NATO Advanced Study Institutes Series: Series B, Physics

Book details

The Physical Object
FormatHardcover
Number of Pages782
ID Numbers
Open LibraryOL9531974M
ISBN 100306402939
ISBN 109780306402937

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From Septembera NATO Advanced Study Institute on Non­ destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy.

A total of 80 attendees and lecturers participated in the program which. Get this from a library. Nondestructive evaluation of semiconductor materials and devices: [lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy, September].

[Jay N Zemel; North Atlantic Treaty Organization. Heime K. () Semiconductor Material Evaluation by Means of Schottky Contacts. In: Zemel J.N. (eds) Nondestructive Evaluation of Semiconductor Materials and Devices.

NATO Advanced Study Institutes Series (Series B: Physics), vol Cited by: 1. We report using a µm(silicon-sub-bandgap) optical probing system to detect electrical signals in silicon integrated circuits.

Free carriers within integrated active devices perturb the index of refraction of the material, and we have used a Nomarski interferometer to sense this perturbation. Typical charge-density modulation in active devices produces a substantial index perturbation, and Cited by: 3. Nondestructive Tests Used to Insure the Integrity of Semiconductor Devices,” Nondestructive Evaluation of Semiconductor Materials and Devices, National Bureau of Standards, Gaithersburg, MD, p.

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Nondestructive Evaluation of Semiconductor Materials and Devices From Septembera NATO Advanced Study Institute on Non­ destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy.

Volume 17 describes the tools and techniques used in nondestructive evaluation and what they reveal about the integrity and operating potential of engineered materials and components. It covers the entire spectrum of sensing technologies from visible light inspection to ultrasonic, thermal, electromagnetic, and radiographic imaging.

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IntroductIon to 1 SemIconductorS CHAPTER OUTLINE 1–1 The Atom 1–2 Materials Used in Electronic Devices 1–3 Current in Semiconductors 1–4 N-Type and P-Type Semiconductors 1–5 The PN Junction CHAPTER OBJECTIVES Describe the structure of an atom Discuss insulators, conductors, and semiconductors and how they differ Describe how current is produced in a semiconductor.

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